Single Event Upset Hardened Design of SRAM Circuits
نویسندگان
چکیده
منابع مشابه
Single Event Upset (SEU) in SRAM
Radiation in space is potentially hazardous to microelectronic circuits and systems such as spacecraft electronics. Transient effects on circuits and systems from high energetic particles can interrupt electronics operation or crash the systems. This phenomenon is particularly serious in complementary metal-oxide-semiconductor (CMOS) integrated circuits (ICs) since most of modern ICs are implem...
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Soft errors resulting from the impact of charged particles are emerging as a major issue in the design of reliable circuits at deep sub-micron dimensions even at ground level. To face this challenge, a designer must dispose of a variety of mitigation schemes adapted to their specific design constraints. Built In Current Sensors have been proposed as a detection scheme for single event upsets in...
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1 ABSTRACT Emerging technology is enabling the design community to consistently expand the amount of functionality that can be implemented within Integrated Circuits (ICs). As the number of gates placed within an FPGA increases, the complexity of the design can grow exponentially. Consequently, the ability to create reliable circuits has become an incredibly difficult task. In order to ease the...
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ژورنال
عنوان ژورنال: DEStech Transactions on Computer Science and Engineering
سال: 2019
ISSN: 2475-8841
DOI: 10.12783/dtcse/ica2019/30757